The aim of this project is to define a mixed signal subsystem for the nanosoc reference design. 

In order to interface with real-world signals in a digital SoC, an analog to digital conversion is needed. The mixed signal subsystem should be able to sample analog signals at a regular sampling rate, and transmit a digital representation of this signal to the rest of the nanosoc system. 

A physical test environment is required for ASIC devices fabricated following tape out. The nanoSoC test board provides a complete test environment for ASIC designs based on the nanoSoC reference design and enables the showcase of any custom designs that utilise it.  Reviewing the function of nanoSoC identifies a number of design criteria for the test board:

The integration of the DMA350 into the nanosoc re-usable SoC architecture will improve the transfer bandwidth on DMA channels within the SoC.  This project integrates the DMA 350 into nanosoc, validates the integration and functionality of the DMA 350, and compares the performance of the DMA 350 to the PL230, that was the initial DMA controller integrated into nanosoc.